Interferometric fringes projection system for 3D profilometry and relief investigation

We present a new 3D full-frame profilometer based on structured laser light projection method. This device takes advantage of the polarization states splitting technique for producing and shifting multiple sinusoidal Young’s interference patterns that are projected on the inspected surface. The principle of the technique is presented and we discuss the advantages of monochromatic light projection method as a mean to overcome ambient lighting for in-situ measurement. Some results that we obtained on objects from the Egyptian Department of the British Museum are presented to demonstrate that 3D laser profilometry is a worthwhile technique for epigraphic investigations where naked-eye inspections fail.